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Effect of volume levels on the complex resistance of a semiconducting contact

✍ Scribed by V. A. Myamlin; Yu. Ya. Gurevich


Book ID
112419387
Publisher
Springer
Year
1964
Tongue
English
Weight
216 KB
Volume
13
Category
Article
ISSN
1573-9171

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In this work the time and temperature dependence of the complex interaction between water and different oxide semiconductor surfaces was examined by resistance measurements in inert and in oxygen containing atmospheres. The experimental temperature varied between 823 and \(1093 \mathrm{~K}\). The wa