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Effect of vacuum heating and ion bombardment of germanium on point contact rectification


Publisher
Elsevier Science
Year
1956
Tongue
English
Weight
136 KB
Volume
6
Category
Article
ISSN
0042-207X

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πŸ“œ SIMILAR VOLUMES


Atomic Force Microscopy Investigation of
✍ Demanet, C. M.; Vijaya Sankar, K.; Malherbe, J. B.; van der Berg, N. G.; Odendaa πŸ“‚ Article πŸ“… 1996 πŸ› John Wiley and Sons 🌐 English βš– 648 KB

Mirror-polished InP(100) samples, ndoped with S atoms to 4 x lo'\* cm-', were bombarded with neon, argon and krypton ions. The energy of the ions was varied from 05-5 keV at a constant angle of incidence at 41" with respect to the sample normal. The ion dose density for Ne' was 1.8 x 10l6 ions cm-'