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Effect of transparency within a semiconductor on emissivity mapping for thermal profile measurements of a semiconductor device

✍ Scribed by Oxley, C.H.; Hopper, R.H.

Book ID: 114445245
Publisher: The Institution of Engineering and Technology
Year: 2007
Tongue: English
Weight: 128 KB
Volume: 1
Category: Article
ISSN: 1751-8822
DOI: 10.1049/iet-smt:20060091

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