Effect of the interface resistance of CoFe/MgO contacts on spin accumulation in silicon

✍ Scribed by Ishikawa, M.; Sugiyama, H.; Inokuchi, T.; Hamaya, K.; Saito, Y.

• Book ID: 111907585
• Publisher: American Institute of Physics
• Year: 2012
• Tongue: English
• Weight: 708 KB
• Volume: 100
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.4728117