Grain-boundary structure of thin films o
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B. Kabius; J.W. Seo; T. Amrein; U. Dähne; A. Scholen; M. Siegel; K. Urban; L. Sc
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Article
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1994
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Elsevier Science
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English
⚖ 919 KB
Thin films of YBa2Cu30~ and Bi2Sr2CaCu2Os were deposited by high-pressure oxygen sputtering and laser ablation, respectively, on bicrystailine substrates of SrTiO3 with angles of 10,24,36 and 45 degrees. The microstructure of the grain boundary in the substrate and in the film was characterized by t