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Effect of the abnormal electric field induced by the passive layer on imprint failures of ferroelectric capacitors

✍ Scribed by X. J. Zheng; W. Yin; T. Zhang; Y. Q. Chen; M. H. Tang; J. Sun

Book ID: 112182875
Publisher: John Wiley and Sons
Year: 2009
Tongue: English
Weight: 523 KB
Volume: 3
Category: Article
ISSN: 1862-6254
DOI: 10.1002/pssr.200903194

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