Effect of substrate generation current on oxide I–V measurement on p-type MOS structures: Han-Sheng Lee. Solid-St. Electron.22, 385 (1979)

• Publisher: Elsevier Science
• Year: 1979
• Tongue: English
• Weight: 132 KB
• Volume: 19
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(79)90523-7