Effect of substrate generation current on oxide I-V measurement on p-type MOS structures

✍ Scribed by Han-Sheng Lee

• Publisher: Elsevier Science
• Year: 1979
• Tongue: English
• Weight: 386 KB
• Volume: 22
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(79)90091-1