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Effect of structural and morphological imperfections on the microwave surface resistance of YBCO thin films

✍ Scribed by A.G. Zaitsev; R. Wördenweber; T. Königs; E.K. Hollmann; S.V. Rasumov; O.G. Vendik


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
515 KB
Volume
264
Category
Article
ISSN
0921-4534

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