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Effect of stress from the glue on single-crystal X-ray intensities at high or low temperatures

✍ Scribed by Argoud, R. ;Muller, J.

Book ID: 114500260
Publisher: International Union of Crystallography
Year: 1989
Tongue: English
Weight: 290 KB
Volume: 22
Category: Article
ISSN: 0021-8898
DOI: 10.1107/s0021889889004206

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