𝔖 Bobbio Scriptorium

✦ LIBER ✦

Effect of steps on low-energy electron diffraction intensity profiles: G E Laramore et al, (Proc 19th Nat Symp Am Vac Soc) J Vac Sci Technol, 10 (1), Jan/Feb 1973, 196–200

Publisher: Elsevier Science
Year: 1973
Tongue: English
Weight: 184 KB
Volume: 23
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(73)92233-1

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Development of continuous sputtering mac

Development of continuous sputtering machines: A M Hanfmann et al, (Proc 19th Nat Symp Am Vac Soc) J Vac Sci Technol, 10 (1), Jan/Feb 1973, 111–114

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FEM studies of oxygen on silver: W A Sch

FEM studies of oxygen on silver: W A Schmidt et al, Abstract. (Proc 19th Nat Symp Am Vac Soc) J Vac Sci Technol, 10(1), Jan/Feb 1973, 295

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Observations of sputtered thin film grow

Observations of sputtered thin film growth: D M Sherman et al, (Proc 19th Nat Symp Am Vac Soc) J Vac Sci Technol, 10 (1), Jan/Feb 1973, 155–159

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Precision determination of surface plasm

Precision determination of surface plasmon dispersion on Al(111) films via inelastic low-energy electron diffraction: C B Duke et al, (Proc 19th Nat Symp Am Vac Soc) J Vac Sci Technol, 10 (1), Jan/Feb 1973, 183–187

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Comparison of theory and expriment in LE

Comparison of theory and expriment in LEED: P M Marcus et al, Abstract. (Proc 19th Nat Symp Am Vac Soc) J Vac Sci Technol, 10 (1), Jan/Feb 1973, 286

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Interaction of carbon monoxide with (110

Interaction of carbon monoxide with (110) nickel: H H Madden et al, Abstract. (Proc 19th Nat Symp Am Vac Soc) J Vac Sci Technol, 10(1), Jan/Feb 1973, 266

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