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Effect of reactive ion etching-induced defects on the surface band bending of heavily Mg-doped p-type GaN

โœ Scribed by Lin, Yow-Jon; Chu, Yow-Lin


Book ID
127270239
Publisher
American Institute of Physics
Year
2005
Tongue
English
Weight
227 KB
Volume
97
Category
Article
ISSN
0021-8979

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