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Effect of pressure and stress on blistering induced by hydrogen implantation in silicon

✍ Scribed by Coupeau, C.; Dion, E.; David, M.-L.; Colin, J.; Grilhé, J.


Book ID
120012986
Publisher
EDP Sciences
Year
2010
Tongue
English
Weight
379 KB
Volume
92
Category
Article
ISSN
0295-5075

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