Effect of physical and chemical modifications on microcrystalline parameters of silk fibers
โ Scribed by H. Somashekarappa; N. Selvakumar; V. Subramaniam; R. Somashekar
- Publisher
- John Wiley and Sons
- Year
- 1996
- Tongue
- English
- Weight
- 365 KB
- Volume
- 59
- Category
- Article
- ISSN
- 0021-8995
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โฆ Synopsis
Wide-angle X-ray diffraction studies of physically and chemically treated silk fibers like bivoltine mulberry silk and tassar silk were carried out to evaluate their crystal size, lattice distortion, and minimum enthalpy, as these determine the properties of silk fibers. The results are also compared with tenacity measurement.
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