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Effect of physical and chemical modifications on microcrystalline parameters of silk fibers

โœ Scribed by H. Somashekarappa; N. Selvakumar; V. Subramaniam; R. Somashekar


Publisher
John Wiley and Sons
Year
1996
Tongue
English
Weight
365 KB
Volume
59
Category
Article
ISSN
0021-8995

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โœฆ Synopsis


Wide-angle X-ray diffraction studies of physically and chemically treated silk fibers like bivoltine mulberry silk and tassar silk were carried out to evaluate their crystal size, lattice distortion, and minimum enthalpy, as these determine the properties of silk fibers. The results are also compared with tenacity measurement.


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