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Effect of partial pressure on the internal stress and the crystallographic structure of r.f. reactive sputtered Ti-N films

✍ Scribed by Shozo Inoue; Takaaki Ohba; Hironori Takata; Keiji Koterazawa


Book ID
114086682
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
343 KB
Volume
343-344
Category
Article
ISSN
0040-6090

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