Effect of Mg content in Cu(Mg)/SiO[sub 2]/Si multilayers on the resistivity after annealing in an oxygen ambient

✍ Scribed by Lee, Wonhee; Cho, Heunglyul; Cho, Bumseok; Kim, Jiyoung; Kim, Yong-suk; Jung, Woo-Gwang; Kwon, Hoon; Lee, Jinhyung; Lee, Chongmu; Reucroft, P. J.

• Book ID: 126846057
• Publisher: AVS (American Vacuum Society)
• Year: 2000
• Tongue: English
• Weight: 439 KB
• Volume: 18
• Category: Article
• ISSN: 0734-2101
• DOI: 10.1116/1.1316101