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Effect of long-term stress on IGFET degradations due to hot electron trapping

โœ Scribed by Matsumoto, H.; Sawada, K.; Asai, S.; Hirayama, M.; Nagasawa, K.


Book ID
114593823
Publisher
IEEE
Year
1981
Tongue
English
Weight
610 KB
Volume
28
Category
Article
ISSN
0018-9383

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