Effect of Localized Interface Charge on the Threshold Voltage of Short-Channel Undoped Symmetrical Double-Gate MOSFETs

✍ Scribed by Ioannidis, E.G.; Tsormpatzoglou, A.; Tassis, D.H.; Dimitriadis, C.A.; Ghibaudo, G.; Jomaah, J.

• Book ID: 114620314
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 361 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2010.2093528