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Effect of length scale on fatigue life and damage formation in thin Cu films

✍ Scribed by D. Wang; C.A. Volkert; O. Kraft

Book ID: 108214491
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 666 KB
Volume: 493
Category: Article
ISSN: 0921-5093
DOI: 10.1016/j.msea.2007.06.092

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