𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Effect of internal stress on the hydriding kinetics of nanocrystalline Pd thin films

✍ Scribed by Delmelle, Renaud; Michotte, Sébastien; Sinnaeve, Marc; Proost, Joris


Book ID
122848583
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
690 KB
Volume
61
Category
Article
ISSN
1359-6454

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES


Effects of internal stresses on the mech
✍ C.T. Chuang; C.K. Chao; R.C. Chang; K.Y. Chu 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 534 KB

Thin films become an important technology because of its outstanding performance in wide engineering applications. The basic of thin film technology is to characterize its mechanical properties, which are strongly dependent on the internal stresses induced by deposition processes. Therefore, an inve

Disorder Effects on the Gap of Thin Si N
✍ S. Ménard; A. Saúl; F. Bassani; F. Arnaud d'Avitaya 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 169 KB 👁 2 views

The gap of Si nanocrystalline films has been computed using a non-orthogonal tight-binding approach. We have studied the influence of different types of disorder: inter-grain distance, intergrain misorientation, and film roughness on the gap value of these Si films. In all the cases, the variation o