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Effect of Intergrowth Defects on the X-Ray Diffraction Pattern. I. Structure Simulations

✍ Scribed by Manaila, R. ;Malis, O. ;Manciu, M. ;Devenyi, A.


Publisher
John Wiley and Sons
Year
1995
Tongue
English
Weight
614 KB
Volume
147
Category
Article
ISSN
0031-8965

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X-Ray diffraction studies on the structu
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## Abstract The X‐ray diffraction of water was measured at 0Β°, 25Β° and 45Β°. An improved method has been used for the calculation of the distribution functions from the experimental data. This method was checked on the data for vitreous SiO~2~ The interpretation of the distribution curves for water