Effect of Interface Roughness on Magnetoresistance and Magnetization Switching in Double-Barrier Magnetic Tunnel Junction

✍ Scribed by Hwang, J.Y.; Lee, S.Y.; Lee, N.I.; Yim, H.I.; Kim, M.Y.; Lee, W.C.; Rhee, J.R.; Chun, B.S.; Kim, T.W.; Kim, Y.K.; Lee, S.S.; Hwang, D.G.; Ri, E.J.

• Book ID: 114653015
• Publisher: IEEE
• Year: 2009
• Tongue: English
• Weight: 791 KB
• Volume: 45
• Category: Article
• ISSN: 0018-9464
• DOI: 10.1109/tmag.2009.2018586