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Effect of interface roughness and polarisation on the optical losses of porous silicon-based waveguides

✍ Scribed by Charrier, J.; Dumeige, Y.; Pirasteh, P.; Gadonna, M.

Book ID
114461796
Publisher
The Institution of Engineering and Technology
Year
2012
Tongue
English
Weight
152 KB
Volume
7
Category
Article
ISSN
1750-0443

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## Abstract We have carried out interferometric measurements of interface roughness in‐situ during electrochemical etching of p‐type porous silicon (PS) at room temperature. We found that at a certain porosity (∼70%) and with an electrolyte where a low fraction (10%) of the ethanol was replaced wit