Effect of incident angle in spectral ellipsometry on composition control during molecular beam epitaxial growth of HgCdTe

✍ Scribed by F. Aqariden; W. M. Duncan; H. D. Shih; L. A. Almeida; M. J. Bevan

• Book ID: 107457880
• Publisher: Springer US
• Year: 1999
• Tongue: English
• Weight: 158 KB
• Volume: 28
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/s11664-999-0066-2