✦ LIBER ✦
HgCdTe composition determination using spectroscopic ellipsometry during molecular beam epitaxy growth of near-infrared avalanche photodiode device structures
✍ Scribed by T. J. De Lyon; G. L. Olson; J. A. Roth; J. E. Jensen; A. T. Hunter; M. D. Jack; S. L. Bailey
- Book ID
- 107452868
- Publisher
- Springer US
- Year
- 2002
- Tongue
- English
- Weight
- 208 KB
- Volume
- 31
- Category
- Article
- ISSN
- 0361-5235
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