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Effect of high temperature aging on reliability of automotive electronics

โœ Scribed by D.G. Yang; F.F. Wan; Z.Y. Shou; W.D. van Driel; H. Scholten; L. Goumans; R. Faria


Book ID
113800582
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
844 KB
Volume
51
Category
Article
ISSN
0026-2714

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