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Effect of high-enthalpy plasma from an explosive source on the inner surface of a cavity and channel

✍ Scribed by V. I. Kirko

Book ID
112409240
Publisher
SP MAIK Nauka/Interperiodica
Year
1978
Tongue
English
Weight
549 KB
Volume
14
Category
Article
ISSN
0010-5082

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## Abstract Time‐of‐flight secondary ion mass spectroscopy (ToF‐SIMS) and x‐ray photoelectron spectroscopy (XPS) have been employed to study the plasma surface oxidation of poly(ether etherketone) (PEEK). The positive and negative ion ToF‐SIM spectra obtained from a cleaned PEEK surface were easily