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Effect of helical slow-wave circuit variations on TWT cold-test characteristics

✍ Scribed by Kory, C.L.; Dayton, J.A., Jr.

Book ID: 114537251
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 147 KB
Volume: 45
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.662813

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