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Effect of H2/O2 ratio on the GeO2 concentration profile in SiO2:GeO2 glass preforms prepared by vapor-phase axial deposition

✍ Scribed by Raul F Cuevas; Edmilton Gusken; Edson H Sekiya; Daniela Y Ogata; Delson Torikai; Carlos K Suzuki

Book ID: 117144509
Publisher: Elsevier Science
Year: 2000
Tongue: English
Weight: 113 KB
Volume: 273
Category: Article
ISSN: 0022-3093
DOI: 10.1016/s0022-3093(00)00134-4

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