Effect of gate bias sweep rate on the electronic properties of ZnO nanowire field-effect transistors under different environments

✍ Scribed by Maeng, Jongsun; Jo, Gunho; Kwon, Soon-Shin; Song, Sunghoon; Seo, Jaeduck; Kang, Seok-Ju; Kim, Dong-Yu; Lee, Takhee

• Book ID: 126305325
• Publisher: American Institute of Physics
• Year: 2008
• Tongue: English
• Weight: 496 KB
• Volume: 92
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.2945637