Arsenic ions were implanted into silicon-on-insulator (SOl) structures at an incident energy of 100 keV to a dose of 2 x 10 lscm-z. Conductive top layers were formed in the SOl structures after annealing at 1200 ~ for 20 s. Infrared reflection spectra in the wave number range of 1500-5000 cm -1 were
✦ LIBER ✦
Effect of fluorine ion implantation on radiation-induced processes in the insulator layer of silicon-on-insulator structures
✍ Scribed by O. P. Gus’kova; V. M. Vorotyntsev; N. D. Abrosimova; E. L. Shobolov; M. N. Mineev
- Book ID
- 114989177
- Publisher
- SP MAIK Nauka/Interperiodica
- Year
- 2012
- Tongue
- English
- Weight
- 181 KB
- Volume
- 48
- Category
- Article
- ISSN
- 0020-1685
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