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Effect of F2 laser power on defect formation in high-purity SiO2 glass

✍ Scribed by Koichi Kajihara; Yoshiaki Ikuta; Masahiro Hirano; Hideo Hosono

Book ID: 117146479
Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 176 KB
Volume: 322
Category: Article
ISSN: 0022-3093
DOI: 10.1016/s0022-3093(03)00177-7

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