✦ LIBER ✦

Effect of electrostatic discharge on semiconductor devices and subsequent annealing of electrostatic defects

✍ Scribed by M. I. Gorlov; I. V. Vorontsov; A. V. Andreev

Book ID: 110544505
Publisher: Springer US
Year: 1998
Tongue: English
Weight: 166 KB
Volume: 41
Category: Article
ISSN: 0543-1972
DOI: 10.1007/bf02512129

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Annealing of Radiation and Electrostatic

Annealing of Radiation and Electrostatic-Discharge Damages in Semiconductor Devices

✍ M. I. Gorlov; D. A. Litvinenko 📂 Article 📅 2002 🏛 Springer 🌐 English ⚖ 147 KB

Constant energy device test for electros

Constant energy device test for electrostatic discharge (ESD) of semiconductor devices

✍ Greason, W.D.; Bulach, S. 📂 Article 📅 1997 🏛 IEEE 🌐 English ⚖ 988 KB

Analysis of the charge transfer of model

Analysis of the charge transfer of models for electrostatic discharge (ESD) and semiconductor devices

✍ Greason, W.D. 📂 Article 📅 1996 🏛 IEEE 🌐 English ⚖ 815 KB

Electrostatic discharge failures of semi

Electrostatic discharge failures of semiconductor devices: B. A. Unger IEEE/Proc. IRPS 193 (1981)

📂 Article 📅 1984 🏛 Elsevier Science 🌐 English ⚖ 98 KB

continued from page 75 precious metal-based materials. These differences are primarily related to the ease of oxidation of the solder alloy powders. The relationship between solder flux chemistry and the reactivity of solder powders is described in terms of functional performance. Production and Pr

Harmful effects of electrostatic dischar

Harmful effects of electrostatic discharges on safety installations

✍ Stig Lundquist 📂 Article 📅 1985 🏛 Elsevier Science 🌐 French ⚖ 193 KB

ELECTROSTATIC DISCHARGE IMPACT ON ELECTR

ELECTROSTATIC DISCHARGE IMPACT ON ELECTRICAL/ELECTRONIC DEVICES, COMPONENTS, ASSEMBLIES, AND EQUIPMENT

✍ TOSHIO OISHI 📂 Article 📅 1979 🏛 American Society of Naval Engineers 🌐 English ⚖ 907 KB