✦ LIBER ✦
Electrostatic discharge failures of semiconductor devices: B. A. Unger IEEE/Proc. IRPS 193 (1981)
- Publisher
- Elsevier Science
- Year
- 1984
- Tongue
- English
- Weight
- 98 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0026-2692
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✦ Synopsis
continued from page 75 precious metal-based materials. These differences are primarily related to the ease of oxidation of the solder alloy powders. The relationship between solder flux chemistry and the reactivity of solder powders is described in terms of functional performance.
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