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Effect of Co impurity layers on the AMR enhancement of Ni thin films

โœ Scribed by C. Prados; D.V. Dimitrov; G.C. Hadjipanayis; A. Hernando


Book ID
114227770
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
186 KB
Volume
177-181
Category
Article
ISSN
0304-8853

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Effect of impurities on intrinsic stress
๐Ÿ“‚ Article ๐Ÿ“… 1976 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 170 KB

Cr, Ti, Hf, Zr, Co, Ta, I'd, and Pt. The AI-Cr system was investigated in some detail using a conductance method and nuclear backscattering for reaction-rate measurements. The compounds CrAl, and Cr2AI,, were identified and their growth was found to be diffusion controlled. The temperature dependenc