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Effect of buffer layer on the structural and morphological properties of GaN films grown with ECR-PEMOCVD

✍ Scribed by Zhang, Dong; Qin, Fuwen; Bai, Yizhen; Bian, Jiming; Li, Shuai; Pan, Li; Zhi, Anbo; Liu, Xinglong; Jiang, Xin

No coin nor oath required. For personal study only.

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