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Effect of biasing at elevated temperature on the electronic structure of Pt/HfO2/Si stacks

✍ Scribed by Yu. Matveyev; A. Zenkevich; Yu. Lebedinskii; S. Thiess; W. Drube

Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 567 KB
Volume: 88
Category: Article
ISSN: 0167-9317
DOI: 10.1016/j.mee.2011.03.104

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