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Effect of a thin transition layer at a Si-SiO2 interface on electron mobility and energy levels

✍ Scribed by Frank Stern

Publisher: Elsevier Science
Year: 1977
Tongue: English
Weight: 298 KB
Volume: 21
Category: Article
ISSN: 0038-1098
DOI: 10.1016/0038-1098(77)90674-3

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