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Effect of a finite r.f. conductance of native oxide on InP metal/insulator/semiconductor admittance

✍ Scribed by B. Bouchikhi; G. Valmont; C. Michel; S. Ravelet

Publisher: Elsevier Science
Year: 1987
Tongue: English
Weight: 418 KB
Volume: 150
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(87)90094-0

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