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Effect of a charged scanned probe microscope tip on a subsurface electron gas

✍ Scribed by M.A. Eriksson; R.G. Beck; M.A. Topinka; J.A. Katine; R.M. Westervelt; K.L. Campman; A.C. Gossard

Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
230 KB
Volume
20
Category
Article
ISSN
0749-6036

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✦ Synopsis

Using a cryogenic scanned probe microscope (SPM) one can locally modify the sheet density of a two-dimensional electron gas (2DEG), and image the ballistic flow of electrons through a point contact in the 2DEG located beneath the surface of a GaAs/AlGaAs heterostructure. We calculate the capacitively induced change in sheet density when a charged SPM tip is brought into contact with a semiconductor heterostructure containing a two-dimensional electron gas. A simple scattering model, based on a local change in sheet density, is used to analyze experimental data taken with the SPM method described above.

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