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EELS analysis of SiC crystals under hydrogen and helium dual-ion beam irradiation

✍ Scribed by K Hojou; S Furuno; K.N Kushita; N Sasajima; K Izui

Book ID
114170203
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
508 KB
Volume
141
Category
Article
ISSN
0168-583X

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In this work, we report on calculations of the electronic channelling energy loss of hydrogen and helium ions along Sih1 0 0i and Sih1 1 0i axial directions for the low energy range by using the Monte Carlo simulation code. Simulated and experimental data are compared for protons and He ions in the