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Edge-connector failure mechanisms : W. J. Byrne. 10th IEEE Annual Proceedings, Reliability Physics (1972), p. 193

Publisher: Elsevier Science
Year: 1973
Tongue: English
Weight: 114 KB
Volume: 12
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(73)90486-1

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