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EDEPR of impurity centers embedded in silicon microcavities

✍ Scribed by N.T. Bagraev; W. Gehlhoff; D.S. Gets; L.E. Klyachkin; A.A. Kudryavtsev; A.M. Malyarenko; V.A. Mashkov; V.V. Romanov

Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
301 KB
Volume
404
Category
Article
ISSN
0921-4526

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