ECS Transactions [ECS China Semiconductor Technology International Conference 2010 (CSTIC 2010) - Shanghai, China (March 18 - March 19, 2010)] - A Comparison of Avalanche Injection of Holes and Total Dose Radiation Effects in RadFETs

✍ Scribed by Tang, Hao; Wang, Yi; Wang, Jinyan; Zheng, Yijun; Jin, Yufeng

• Book ID: 127250296
• Publisher: ECS
• Year: 2010
• Weight: 313 KB
• Category: Article
• DOI: 10.1149/1.3360766