✦ LIBER ✦

ECS Transactions [ECS 218th ECS Meeting - Las Vegas, NV (October 10 - October 15, 2010)] - Ellipsometry, Reflectometry, and XPS Comparative Studies of Oxidation Effects on Graded Porous Silicon Antireflection Coatings

✍ Scribed by Selj, Josefine H.; Tho̸gersen, Annett; Stensrud Marstein, Erik

No coin nor oath required. For personal study only.

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