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Dynamic scan: driving down the cost of test

✍ Scribed by Samaranayake, S.; Sitchinava, N.; Kapur, R.; Amin, M.B.; Williams, T.W.

Book ID: 114574944
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 293 KB
Volume: 35
Category: Article
ISSN: 0018-9162
DOI: 10.1109/mc.2002.1039519

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