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Dynamic characterization of nanoelectromechanical oscillators by atomic force microscopy

✍ Scribed by B. Ilic; S. Krylov; L. M. Bellan; H. G. Craighead

Book ID: 126737198
Publisher: American Institute of Physics
Year: 2007
Tongue: English
Weight: 926 KB
Volume: 101
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.2472277

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