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Nonlinear detection mechanism in quantitative atomic force microscopy characterization of high-frequency nanoelectromechanical systems

✍ Scribed by Serra-García, Marc; Pérez-Murano, Francesc; San Paulo, Alvaro


Book ID
111952905
Publisher
The American Physical Society
Year
2012
Tongue
English
Weight
1005 KB
Volume
85
Category
Article
ISSN
1098-0121

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