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Dual-environment effects on the oxidation of metallic interconnects

✍ Scribed by Gordon R. Holcomb; Malgorzata Ziomek-Moroz; Stephen D. Cramer; Bernard S. Covino; Sophie J. Bullard


Book ID
111786494
Publisher
Springer US
Year
2006
Tongue
English
Weight
335 KB
Volume
15
Category
Article
ISSN
1059-9495

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