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Dual-Channel Multiplex System for Precise Measurement of Displacement and Shape of Spectral Lines

✍ Scribed by Rostas, F. ;Lemaire, J. L. ;Felenbok, P.


Book ID
115321096
Publisher
The Optical Society
Year
1971
Tongue
English
Weight
666 KB
Volume
10
Category
Article
ISSN
1559-128X

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A dual-function ESPI system is developed for the measurement of out-of-plane displacement and its slope change. The proposed system is convenient and also efficient to switch over from an out-of-plane sensitive configuration to shearography. A difference-ofphase method with a five-step algorithm is